ACM International Conference on Computing Frontiers


May 5 - 7, 2008 Ischia, Italy

CALL-FOR-PAPERS

Workshop on
Radiation Effects and Fault Tolerance in Nanometer Technologies

The Technology Roadmap for Semiconductors (ITRS) has identified that beyond 90nm CMOS technology soft errors severely impact field-level product reliability, not only for embedded memory, but for logic as well. Soft errors are upsets with transient effects that can occur in integrated circuits due to the interaction of energetic particles with the circuit substrate. The goal of this half-day workshop is to present the latest research on radiation effects and fault tolerance strategies to provide reliability in nanometer technologies. This includes work on modeling, testing and design at device, circuit and system level.

 

Paper Submission and Publication

All accepted papers for the Workshop 
will be included in the Computing Frontiers
Conference Proceedings published by ACM.

 

Submission deadline: February 10th, 2008

Author notification: February 25th, 2008

Manuscript Deadline: March 5th, 2008

 

 

Submission Guidelines:

Up to 12 pages in length

Single column

Double spaced

 

Please send your workshop paper manuscript in pdf format to Fernanda Lima Kastensmidt: fglima@inf.ufrgs.br.

More information at: http://www.computingfrontiers.org/

sponsored by ACM,

SIGMICRO and

IBM Research

Topics

Suggested topics, but are not limited to:

   Radiation effects in nanometer technologies

   Characterization and Modeling of soft errors in integrated circuits

   Soft error vulnerability in architectures and applications

   Soft error detection/tolerance techniques for architectures and applications

   Application/circuit-specific error detection/correction algorithms

   Security implications of ambient and malicious soft errors (malicious = under heating lamp/neutron beam)

   On-line monitoring of current, temperature and other reliability indicators

   System-on-Chip (SoC): computation on many unreliable cores

   Network-on-Chips (NoC): reliability on hash environments

   Reconfigurable Computing for fault tolerance

   Fault tolerance techniques for Field Programmable Gate Arrays (FPGAs)

Workshop Organizers
Fernanda Lima Kastensmidt
Universidade Federal do Rio Grande do Sul, Brazil
fglima@inf.ufrgs.br

Greg Bronevetsky

Lawrence Livermore National Lab, USA

bronevetsky1@llnl.gov

 

Program Committee

Christian Engelmann, Oak Ridge National Laboratory, USA
George Ostrouchov, Oak Ridge National Laboratory, USA
Hugh Barnaby, Arizona State University, USA
Lorena Anghel, Institut Polytechnique de Grenoble, France
Massimo Violante, Politecnico di Torino, Italy
Manuel Gericota, Instituto Superior de Engenharia do Porto, Portugal
Subhasish Mitra, Stanford University, USA

Ricardo Reis, UFRGS, Brazil

Gilson Wirth, UFRGS, Brazil

Monica Alderighi, INAF, Italy